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ESIM: A Multimodel Design Error and Fault Simulator for Logic Circuits.

Hussain Al-AsaadJohn P. Hayes
Published in: VTS (2000)
Keyphrases
  • logic circuits
  • functional decomposition
  • case study
  • user interface
  • low power
  • circuit design
  • gate array
  • pattern recognition
  • hidden markov models
  • fault diagnosis
  • simulation environment
  • logic synthesis