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On-chip Timing Uncertainty Measurements on IBM Microprocessors.
Robert L. Franch
Phillip J. Restle
James K. Norman
William V. Huott
Joshua Friedrich
R. Dixon
Steve Weitzel
K. van Goor
G. Salem
Published in:
ITC (2008)
Keyphrases
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single chip
measurement noise
measurement errors
measurement error
level parallelism
high speed
uncertain data
personal computer
low cost
vlsi implementation
ibm power processor
computing power
measured data
circuit design
decision theory
physical design
leading edge
low power
normal flow