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Improvements in Automated IC Socket Pin Defect Detection.
Vijayakumar Thangamariappan
Nidhi Agrawal
Jason Kim
Constantinos Xanthopoulos
Ken Butler
Ira Leventhal
Joe Xiao
Published in:
ITC (2022)
Keyphrases
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defect detection
feature extraction
semi automated
integrated circuit
automated visual inspection
computer aided
data mining
computer assisted
automated analysis
textured surfaces
information systems
artificial neural networks
hidden markov models