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Analysis of PI-Control for Atomic Force Microscopy in Contact Mode.

Saverio MessineoMichael R. P. RagazzonFabio BusnelliJan Tommy Gravdahl
Published in: IEEE Trans. Control. Syst. Technol. (2022)
Keyphrases
  • reinforcement learning
  • machine learning
  • artificial intelligence
  • pattern recognition
  • evolutionary algorithm
  • computational intelligence
  • genetic programming
  • atomic force microscopy