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Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs.

Mitsuya FukazawaTetsuro MatsunoToshifumi UemuraRei AkiyamaTetsuya KagemotoHiroshi MakinoHidehiro TakataMakoto Nagata
Published in: ISSCC (2007)
Keyphrases
  • fine grained
  • coarse grained
  • access control
  • tightly coupled
  • high speed
  • massively parallel
  • dynamical systems
  • markov processes
  • pairwise
  • language model
  • shared memory