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Analysis of op-amp phase margin impact on SC SigmaDelta modulator performance.

Andrea PuglieseFrancesco A. AmorosoGregorio CappuccinoGiuseppe Cocorullo
Published in: Microelectron. J. (2010)
Keyphrases
  • statistical analysis
  • knowledge base
  • decision trees
  • image segmentation
  • support vector
  • feature space
  • image analysis
  • multiresolution