Films Using Two Sputtering Sources.

Yoichi Hoshi Kensuke Yagi Eisuke Suzuki Hao Lei Akira Sakai

Published in: IEICE Trans. Electron. (2008)

Keyphrases

information sources
information retrieval
multiple sources
film thickness
neural network
computer vision
bayesian networks
relational databases
data sources
knowledge sources
grain size
electrical properties