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Modeling Dark Current Degradation of Monolithic InGaAs/GaAs-On-Si Nano-Ridge Photodetectors.

Ping-Yi HsiehAmeni Ben DrissArtemisia TsiaraBarry J. O'SullivanDidit YudistiraBernardette KunertJoris Van CampenhoutIngrid De Wolf
Published in: IRPS (2024)
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