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On the influence of overlap in automatic root cause analysis in manufacturing.
Eduardo E. Oliveira
Vera L. Miguéis
José Luis Cabral de Moura Borges
Published in:
Int. J. Prod. Res. (2022)
Keyphrases
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root cause analysis
manufacturing systems
root cause
data sets
data mining
semi automatic
quality control
manufacturing processes
data driven
production planning
factors influencing
manufacturing industry
real world
expert systems
semiconductor manufacturing
prior studies