On the Resiliency of NCFET Circuits Against Voltage Over-Scaling.
Guilherme PaimGeorgios ZervakisGirish PahwaYogesh Singh ChauhanEduardo Antonio Cesar da CostaSergio BampiJörg HenkelHussam AmrouchPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2021)