Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application.
Jaehun LeeYoungcheon JeongKyongsik YeomChangmin JeonJongsung WooSangjin LeeGa-Young LeeDong-Hwee HwangYong Seok ChungMinji SeoDong-Hyun KimDalHwan KimYongsik KimHyunChang LeeSoomin ChoMyeongHee OhHyun-Jin ShinGun Rae KimSungyoung YoonYong Kyu LeeYoung Ki HongPublished in: IMW (2021)
Keyphrases
- high density
- highly reliable
- high speed
- software development environment
- low density
- knowledge based systems
- design process
- development process
- decision support
- automotive industry
- case study
- software application
- development environment
- practical application
- rapid prototyping
- requirements engineering
- close proximity
- magnetic recording
- software engineering
- development lifecycle
- application specific
- thin film
- real time
- low power
- embedded systems
- software development
- databases