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Voltage Reference in 65-nm CMOS Exploiting Well-Proximity Effect.
Chengyu Che
Ka-Meng Lei
Rui Paulo Martins
Pui-In Mak
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2023)
Keyphrases
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power supply
low voltage
cmos technology
leakage current
high speed
low cost
power system
computer vision
steady state
low power
real time
power consumption
delay insensitive
metal oxide