Login / Signup
Empirical correlation between package-level ball impact test and board-level drop reliability.
Chang-Lin Yeh
Yi-Shao Lai
Hsiao-Chuan Chang
Tsan-Hsien Chen
Published in:
Microelectron. Reliab. (2007)
Keyphrases
</>
correlation coefficient
levels of abstraction
information retrieval
web services
high level
database systems
special case
mobile robot
higher level
individual level