Ising spin-grass error correction for unreliable nanoelectronic logic circuits.
Yasuhiro OkadaHisato FujisakaTakeshi KamioChang-Jun AhnKazuhisa HaeiwaPublished in: ECCTD (2009)
Keyphrases
- error correction
- logic circuits
- low power
- tunnel diode
- functional decomposition
- markov random field
- gate array
- data hiding
- error detection
- logic synthesis
- error correcting
- channel coding
- low cost
- error control
- power consumption
- power dissipation
- real time
- ldpc codes
- bit errors
- watermarking scheme
- high speed
- error detection and correction
- pairwise