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Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing.

A. FrischMitch AignerT. AlmyHans J. GreubM. HazraS. MohrNicholas J. NaclerioW. RussellM. Stebniskey
Published in: ITC (1995)
Keyphrases
  • low cost
  • embedded systems
  • hardware and software
  • real time
  • computer vision
  • test set
  • low power
  • information retrieval
  • digital libraries
  • object oriented
  • test cases
  • test generation
  • single chip