Login / Signup

Built-in Self Test Power and Test Time Analysis in On-chip Networks.

Mahdieh Nadi SenejaniMahdiar Hosein GhadiryChia Yee OoiMuhammad Nadzir Marsono
Published in: Circuits Syst. Signal Process. (2015)
Keyphrases
  • built in self test
  • low cost
  • quantitative analysis
  • data sets
  • database
  • real time
  • power consumption
  • analog vlsi