Login / Signup
Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point.
Michail Noltsis
Eleni Maragkoudaki
Dimitrios Rodopoulos
Francky Catthoor
Dimitrios Soudris
Published in:
PATMOS (2017)
Keyphrases
</>
failure rate
probability distribution
failure detection
data sets
genetic algorithm
real time
decision trees
databases
artificial intelligence
social networks
similarity measure
low power
root cause
failure modes
failure recovery