Lifetime evaluation for Hybrid-Drain-embedded Gate Injection Transistor (HD-GIT) under practical switching operations.
Ayanori IkoshiMasahiro TokiHiroto YamagiwaDaijiro ArisawaMasahiro HikitaKazuki SuzukiManabu YanagiharaYasuhiro UemotoKenichiro TanakaTetsuzo UedaPublished in: IRPS (2018)