Sign in
Lifetime reliability characterization of N/MEMS used in power gating of digital integrated circuits.
Haider Alrudainy
Rishad A. Shafik
Andrey Mokhov
Alex Yakovlev
Published in:
DFT (2017)
Keyphrases
</>
integrated circuit
total energy
power consumption
electron beam
printed circuit boards
metal oxide semiconductor
neural network
genetic algorithm
signal processing
life span
power distribution systems
energy consumption
imaging systems
hardware description language
analog to digital converter