A New Method for Testing Re-Programmable PLAs.
Charles E. StroudJames R. BaileyJohan R. EmmertPublished in: J. Electron. Test. (2000)
Keyphrases
- detection method
- high accuracy
- cost function
- clustering method
- main contribution
- preprocessing
- high precision
- mathematical model
- error rate
- computationally efficient
- edge detection
- low cost
- classification accuracy
- probabilistic model
- computational cost
- significant improvement
- feature set
- em algorithm
- synthetic data
- experimental study
- matching algorithm
- computer vision