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Fully integrated Si: HfO2 Negative Capacitance 2D-2D WSe2/SnSe2 Subthermionic Tunnel FETs.
Sadegh Kamaei
Ali Saeidi
Xia Liu
Carlotta Gastaldi
Clara Moldovan
Jürgen Brugger
Adrian M. Ionescu
Published in:
ESSCIRC (2022)
Keyphrases
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fully integrated
high speed
leakage current
workflow management
low power
electrical properties
database
knowledge representation
low voltage