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Physical-design-friendly hierarchical logic built-in self-test - A case study.

Kelvin NelsonJaga ShanmugavadiveluJayanth MekkothVenkat GhantaJun WuFei ZhuangHao-Jan ChaoShianling WuJie RaoLizhen YuLaung-Terng Wang
Published in: ISQED (2012)
Keyphrases
  • physical design
  • built in self test
  • chip design
  • design methodology
  • query optimization
  • integrated circuit
  • design tools
  • database administrators
  • case study
  • database
  • genetic algorithm
  • image analysis