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Physical-design-friendly hierarchical logic built-in self-test - A case study.
Kelvin Nelson
Jaga Shanmugavadivelu
Jayanth Mekkoth
Venkat Ghanta
Jun Wu
Fei Zhuang
Hao-Jan Chao
Shianling Wu
Jie Rao
Lizhen Yu
Laung-Terng Wang
Published in:
ISQED (2012)
Keyphrases
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physical design
built in self test
chip design
design methodology
query optimization
integrated circuit
design tools
database administrators
case study
database
genetic algorithm
image analysis