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TSV-aware Scan Chain Reordering for 3D IC.

Ayan DattaCharudhattan NagarajanSusmita Sur-Kolay
Published in: ISVLSI (2011)
Keyphrases
  • integrated circuit
  • scan data
  • pairwise
  • genetic algorithm
  • high level
  • high quality
  • multiscale
  • relational databases
  • evolutionary algorithm
  • connected component labeling