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The influence of Büttiker probe scattering to the port behavior of nanoscale metal-oxide-semiconductor devices.

Jian XiongGen WangWolfgang Mathis
Published in: Int. J. Circuit Theory Appl. (2013)
Keyphrases
  • semiconductor devices
  • metal oxide
  • real time
  • electron beam
  • image enhancement
  • database
  • image processing
  • management system
  • high speed
  • x ray
  • solid state