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XID: Don't care identification of test patterns for combinational circuits.

Kohei MiyaseSeiji Kajihara
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2004)
Keyphrases
  • logic circuits
  • asynchronous circuits
  • pattern analysis
  • long term
  • data streams
  • spatio temporal
  • low cost
  • high speed
  • decision support system
  • pattern mining
  • design patterns
  • medical care
  • logic synthesis