Fast and low-area TPGs based on T-type flip-flops can be easily integrated to the scan path.

Tomasz Garbolino Andrzej Hlawiczka Adam Kristof

Published in: ETW (2000)

Keyphrases

scan path
flip flops
pattern recognition
image processing
object recognition
low level
dynamic programming
eye movements
usability testing
multiple input
levenshtein distance