A Statistical Algorithm for Power- and Timing-Limited Parametric Yield Optimization of Large Integrated Circuits.
Murari ManiAnirudh DevganMichael OrshanskyYaping ZhanPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
- low cost
- optimization algorithm
- detection algorithm
- cost function
- integrated circuit
- experimental evaluation
- optimization process
- expectation maximization
- learning algorithm
- dynamic programming
- np hard
- k means
- preprocessing
- search space
- matching algorithm
- computational complexity
- stochastic gradient
- linear programming
- simulated annealing
- improved algorithm
- global optimization
- combinatorial optimization
- clustering method
- segmentation algorithm
- particle swarm optimization
- optimization problems
- high accuracy
- worst case
- probabilistic model
- computational cost
- optimal solution