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Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors.

Michael JohnsonBrian NobleMark JohnsonJim CraftsCynthia ManyaJohn Deforge
Published in: ITC (2016)
Keyphrases
  • monitoring system
  • real time
  • error detection
  • highly reliable
  • neural network
  • computer vision
  • information systems
  • operating system
  • parallel algorithm
  • shared memory
  • reliability analysis