III-V HBTs on 300 mm Si substrates using merged nano-ridges and its application in the study of impact of defects on DC and RF performance.

Abhitosh Vais Sachin Yadav Yves Mols Bjorn Vermeersch Komal Vondkar Kodandarama Marina Baryshnikova G. Mannaert R. Alcotte Geert Boccardi Piet Wambacq Bertrand Parvais R. Langer Bernardette Kunert Nadine Collaert

Published in: ESSDERC (2022)

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