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A Built-In Self-Test and In Situ Analog Circuit Optimization Platform.

Sanghoon LeeCongyin ShiJiafan WangAdriana C. Sanabria-BorbonHatem OsmanJiang HuEdgar Sánchez-Sinencio
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2018)
Keyphrases
  • analog circuits
  • optimization problems
  • fault diagnosis
  • global optimization
  • optimization algorithm
  • real time
  • computer vision
  • artificial intelligence
  • wavelet packet transform