Low-leakage soft error tolerant dual-port SRAM cells for cache memory applications.

Arash Azizi Mazreah Mohammad T. Manzuri Shalmani

Published in: Microelectron. J. (2012)

Keyphrases

error tolerant
graph matching
dynamic random access memory
main memory
random access memory
memory access
memory subsystem
power consumption
subgraph isomorphism
memory management
query processing
neural network
association patterns
leakage current