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Improving compute in-memory ECC reliability with successive correction.

Brian CraftonZishen WanSamuel SpetalnickJong-Hyeok YoonWei WuCarlos TokunagaVivek DeArijit Raychowdhury
Published in: DAC (2022)
Keyphrases
  • error correction
  • error detection
  • error correcting
  • memory usage
  • multiscale
  • main memory
  • memory requirements
  • computing power
  • database
  • evolutionary algorithm
  • error analysis
  • random access
  • memory size