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Design of High-Reliability Memory Cell to Mitigate Single Event Multiple Node Upsets.
Hongchen Li
Liyi Xiao
Chunhua Qi
Jie Li
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2021)
Keyphrases
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high reliability
high precision
memory usage
design decisions
low cost
design process
computer aided
news articles
database systems