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Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection.

Leonardo R. GobattoFabio BenevenutiNemitala AddedSaulo G. AlbertonEduardo L. A. MacchioneVitor A. P. AguiarNilberto H. MedinaFernanda Lima KastensmidtJosé Rodrigo Azambuja
Published in: LATS (2024)
Keyphrases
  • reliability assessment
  • fault injection
  • java card
  • bp neural network model
  • fault model
  • parallel algorithm
  • power system
  • smart card
  • static analysis
  • sensor networks
  • countermeasures