Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis.

Isabella Rossetto Matteo Meneghini Vanessa Rizzato Maria Ruzzarin Andrea Favaron Steve Stoffels Marleen Van Hove Niels Posthuma Tian-Li Wu Denis Marcon Stefaan Decoutere Gaudenzio Meneghesso Enrico Zanoni

Published in: Microelectron. Reliab. (2016)

Keyphrases