A novel fault diagnosis method for analog circuits with noise immunity and generalization ability.
Tianyu GaoJingli YangShouda JiangPublished in: Neural Comput. Appl. (2021)
Keyphrases
- generalization ability
- noise immunity
- analog circuits
- fault diagnosis
- bp neural network
- learning algorithm
- support vector machine svm
- digital circuits
- support vector machine
- support vector
- neural network
- rotation invariance
- retrieval accuracy
- ensemble methods
- knn
- image processing
- fourier transform
- computer vision
- multiscale
- pattern recognition
- frequency domain
- back propagation
- image classification
- artificial neural networks