Discrimination of True Defect and Indefinite Defect with Visual Inspection Using SVM.

Yuji Iwahori Kazuya Futamura Yoshinori Adachi

Published in: KES (4) (2011)

Keyphrases

visual inspection
image analysis
defect detection
support vector machine svm
feature selection
support vector
training data
knn
support vector machine
multi class
printed circuit boards
fluorescence microscopy images
support vectors
kernel methods
kernel function
active learning
image processing