Simultaneous topography imaging and broadband nanomechanical property mapping using atomic force microscope.
Tianwei LiQingze ZouPublished in: ACC (2017)
Keyphrases
- synthetic aperture
- imaging systems
- image analysis
- radar data
- high resolution
- image processing
- medical imaging
- computer vision
- desirable properties
- visual inspection
- data acquisition
- high speed
- high dynamic range
- digital images
- clinical applications
- imaging process
- mobile robot
- image sequences
- synthetic aperture sonar
- atomic force microscopy