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On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization.
Muralidharan Jayabalan
E. Srinivas
Francis H. Shajin
P. Rajesh
Published in:
J. Electron. Test. (2021)
Keyphrases
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test data
microstrip antenna
test set
test cases
training data
training set
data sets
optimization algorithm
training and test data
database
database systems
active learning
supervised learning
training samples
missing values
search based testing