Lumped passive circuits for 5GHz embedded test of RF SoCs.

Jangsup Yoon William R. Eisenstadt

Published in: ISCAS (1) (2004)

Keyphrases

high speed
frequency band
relevance feedback
test data
analog vlsi
digital images
low cost
embedded systems
statistical tests
radio frequency
data sets
neural network
low power
statistical significance
circuit design
lateral inhibition