B-open Defect: A Novel Defect Model in FinFET Technology.
Freddy ForeroVíctor H. ChampacMichel RenovellPublished in: ACM J. Emerg. Technol. Comput. Syst. (2023)
Keyphrases
- high level
- statistical model
- knowledge base
- formal model
- computational model
- theoretical analysis
- probability distribution
- similarity measure
- probabilistic model
- prior knowledge
- management system
- data processing
- multi agent
- objective function
- mathematical model
- network structure
- sensitivity analysis
- neural network model
- simulation model
- artificial intelligence