On-chip Tests for Gain Bandwidth Product and Slew Rate.
Kartahik RamamurthyJohn G. KenneyGiri RanganPublished in: ISCAS (1993)
Keyphrases
- transmission rate
- bandwidth utilization
- high bandwidth
- allocation scheme
- low cost
- high speed
- video streaming
- channel capacity
- test cases
- quality of service
- vlsi implementation
- circuit design
- life cycle
- network bandwidth
- product design
- bandwidth allocation
- high density
- product quality
- rate allocation
- physical design
- evolvable hardware
- programmable logic
- channel conditions
- end to end
- chip design
- operating system