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Defect characterization of InAs/InGaAs quantum dot photodetector grown on GaAs-on-V-grooved-Si substrate.

Jian HuangYating WanDaehwan JungJustin NormanChen ShangQiang LiKei May LauArthur C. GossardJohn E. BowersBaile Chen
Published in: DRC (2019)
Keyphrases
  • low energy electron
  • quantum computation
  • injection lasers
  • gallium arsenide
  • case study
  • real time
  • artificial neural networks
  • quantum computing
  • metal oxide