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Metrology for information technology.
Lisa Carnahan
Gary Carver
Martha Gray
Michael Hogan
Theodore Hopp
Jeffrey Horlick
Gordon Lyon
Elena Messina
Published in:
ACM Stand. (1997)
Keyphrases
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information technology
camera calibration
information systems
researchers and practitioners
single view
process control
south africa
information society
neural network
machine learning
artificial intelligence
feature selection
database systems
human capital
innovative ideas