Login / Signup

Determination of Defect Concentrations in ²⁸Si Crystals Using EPR for the Realization of the Kilogram.

Shigeki MizushimaNaoki KuramotoTakahide Umeda
Published in: IEEE Trans. Instrum. Meas. (2021)
Keyphrases
  • neural network
  • image retrieval
  • data sets
  • databases
  • information systems
  • automated visual inspection
  • metal oxide