SEU tolerance of FinFET 6T SRAM, 8T SRAM and DICE memory cells.

Ahmed S. Sajit Michael A. Turi

Published in: CCWC (2017)

Keyphrases

random access memory
power consumption
data transmission
design considerations
dynamic random access memory
low power
embedded dram
database
real time
cellular automaton
low voltage
data sets
website
case study
low cost