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Detecting correlative light and electron microscopic labels by electron spectroscopic imaging.
Martin Pfannmöller
Ira V. Röder
Gerd Benner
York Stierhof
Irene U. Wacker
Rasmus R. Schröder
Published in:
ISBI (2012)
Keyphrases
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electron microscope
electron microscopy
electron beam
electric field
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training data
machine learning
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x ray
automatic detection
high energy
van der waals