Making Classification Competitive for Deep Metric Learning.
Andrew ZhaiHao-Yu WuPublished in: CoRR (2018)
Keyphrases
- metric learning
- distance metric learning
- nearest neighbor classification
- machine learning and pattern recognition
- margin maximization
- pattern recognition
- feature space
- distance metric
- image classification
- classification accuracy
- decision trees
- pairwise
- semi supervised
- support vector
- learning tasks
- text classification
- kernel learning
- machine learning algorithms
- class labels
- supervised learning
- feature set
- support vector machine
- feature vectors
- machine learning
- neural network
- data sets
- image processing