6T SRAM and 3T DRAM data retention and remanence characterization in 65nm bulk CMOS.

Cagla Cakir Mudit Bhargava Ken Mai

Published in: CICC (2012)

Keyphrases

database
data sets
synthetic data
raw data
data analysis
data sources
data points
data processing
data collection
databases
database systems
image data
high speed
data acquisition
power consumption