Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate.

Gaudenzio Meneghesso Matteo Meneghini Davide Bisi Isabella Rossetto Tian-Li Wu Marleen Van Hove Denis Marcon Steve Stoffels Stefaan Decoutere Enrico Zanoni

Published in: Microelectron. Reliab. (2016)

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